Back to Top

Sie sind hier


SEMICAPS designs, manufactures and markets innovative fault localization microscopes which are used by the top semiconductor companies. Customers use these equipment for their design-debug and yield analysis work. These world leading instruments help users to, efficiently and quickly, ramp up the yield of their latest chip designs by analyzing and locating faults in their engineering samples and early production runs.
Our laser scan microscope has already been qualified and is being used by a large manufacturer for their 14 nm products. Presently, our optics for NIR laser scanning is able to achieve the best resolution of below 100 nm linewidth. Further, Global Foundries is using our wafer probe platform to accelerate their wafer yield analysis, saving them weeks per analysis cycle by avoiding the need to sort, dice and package the products before analysis. These direct-docked, direct-probe analytical wafer probers allow users to test their wafers at over 1 Gbps, while using a standard commercial probe card with over 5000 pins.
Our technical staff has strong backgrounds in semiconductor failure analysis, microscopy and the use of lasers as well as computer hardware and software. Working closely with customers, we also have an in-depth appreciation of the application requirements of the industry. SEMICAPS also work closely with the National University of Singapore to develop new fundamental technologies. Currently, we have about 30 staff located in Singapore,  Taiwan and USA. The SEMICAPS team has been awarded the President’s Technology Award in 2009, Singapore’s highest award for science and technology. The company also has been granted 9 patents.
Find more information here

Wir möchten Sie gerne darüber informieren, dass wir Cookies verwenden um Ihnen eine angenehme Nutzung unserer Webseite zu bieten. Sie erklären sich mit diesem Vorgehen einverstanden indem Sie hier auf “Zustimmen” klicken. Weitere Informationen dazu finden Sie in unseren Datenschutzrichtlinien.