Back to Top

You are here


The first TEM sample preparation system using the disruptive new AIM technology, delivering significantly reduced turnaround times and enhanced productivity. AIM , SELA's unique Adaptive Ion Milling technology, is superior to the traditional Focused Ion Beam technology (FIB). AIM (TM) can reduce sample widths to below 50 nanometers over a large area with high precision, artifact free (wedge-like) quality, and higher throughput.

SELA's newest system, Xact, introduces a twin-beam combination uniquely configured for more precise end-point detection and artifact-free sample clarity. The Xact joins SELA's SEM-oriented Microcleaving solution to set the standard for high-quality, automated engineering.

Our website uses cookies. By continuing we assume your permission to deploy cookies, as detailed in our privacy policy.